Xi X.X., Tantawi S., Lee N., Kustom R.L., Tan T., Wolak M.A., Withanage W.K., Nassiri A., Welander P.B., Franzi M.
Ключевые слова: MgB2, films, HPCVD process, substrates, disks, Cu-based conductors, fabrication
Ключевые слова: MgB2, thin films, supporting structure, buffer layers, pinning, critical caracteristics, microstructure, Jc/B curves, pinning force
Ключевые слова: MgB2, thin films, buffer layers, substrate sapphire, fabrication, microstructure, PLD process, critical caracteristics, Jc/B curves, pinning force
Ключевые слова: HTS, REBCO, PLD process, substrate SrTiO3, thickness dependence, critical current density, temperature dependence, Jc/B curves, microstructure
Chung K.C., Kim H.S., Park C., Oh S.S., Ha H.S., Lee N.J., Jang S.H., Moon S.H., Youm D.J., Min C.H.
Ключевые слова: HTS, REBCO, IBAD process, coated conductors, composition, buffer layers, thermal evaporation, co-evaporation process, microstructure, fabrication
Ключевые слова: MgB2, films thick, substrate sapphire, defects columnar, grain size, pinning force, microstructure, experimental results
Kim H.S., Youm D., Yoo J., Ha H.S., Ha D.W., Song K.J., Ko R.K., Oh S., Lee N.J., Moon S.H., Yoo S.I., Yang J.S., Kim T.H., Kim H.K., Ko K.P., Yu K.K.
Ключевые слова: HTS, REBCO, coated conductors, RABITS process, IBAD process, co-evaporation process, long conductors, fabrication, composition, microstructure, critical current density, oxygenation treatments, heat treatment, current-voltage characteristics, Jc/B curves, YBCO, PLD process, angular dependence, presentation, critical caracteristics
Ключевые слова: FCL resistive, matrix, shunt, coils, current limiting characteristics, experimental results, HTS, YBCO, films, substrate LaAlO3, power equipment
Ключевые слова: HTS, FCL inductive, YBCO, films, recovery characteristics, quench properties, experimental results, power equipment
Kim H.S., Youm D., Park C., Oh S.S., Ha H.S., Song K.J., Ko R.K., Lee N.J., Park Y.M., Moon S.H., Yoo S.I., Yang J.S., Kim T.H., Jeong H.Y.
Ключевые слова: HTS, REBCO, coated conductors, IBAD process, substrate Ni-W, buffer layers, fabrication
Nagaya S., Kashima N., Doi T., Lee N.J.(njlee@elib.eee.kagoshima-u.ac.jp), Hakuraku Y.
Ключевые слова: HTS, YBCO, coated conductors, substrate Ag, MOD process, microstructure, fabrication
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